Monday, April 15, 2024, 7AM - 7PM EST
Event: 2024 Frontiers of Characterization and Metrology for Nanoelectronics (FCMN 2024)
Location: Monterey Marriott, Monterey, California
Contact: James Liddle
, Alain Diebold
The FCMN will bring together scientists and engineers interested in all aspects of the characterization technology needed for nanoelectronic materials and device research, development, integration, and manufacturing. All approaches are welcome: chemical, physical, electrical, magnetic, optical, in situ, and real-time control and monitoring. The semiconductor industry is evolving rapidly: the conference will highlight major issues and provide critical reviews of important materials and structure characterization and nearline/inline metrology methods, including hardware, data analysis, and AI and machine learning, as the industry both extends the technology deep into the nanoscale and increases the diversity of devices and systems.