Education & Outreach > Short Courses > Short Course Catalog > Materials Characterization > Scanning Electron Microscopy and X-ray Microanalysis

Scanning Electron Microscopy and X-ray Microanalysis


Course:
Scanning Electron Microscopy and X-ray Microanalysis

Course Objectives

  • Understand the basics of electron guns, optics and imaging concepts.
  • Learn about the basic nodes of secondary and backscattered electron imaging, etc.
  • Be introduced to the concepts of resolution, contrast, charging, etc.
  • Learn about both qualitative and quantitative analysis.

Course Description

The courses provides an overview of conventional and field emission SEM and SEM-based x-ray microanalysis for engineers and physical scientist.

Starting with the basics of electron guns and optics, the course develops imaging concepts. Examination of the electron beam/sample interactions provides the tools to understanding the basic nodes of secondary and backscattered electron imaging and issues such as resolution, contrast, charging, etc. Detectors for electrons as well as x-ray (EDS and WDS) are reviewed. Aspects of qualitative and quantitative analysis are then developed.

The course concludes with case studies, general guidelines, and practical aspects of SEM imaging and analysis.

Course Materials

Course Notes

Course Cost: $690

Who should attend?

Technicians, process engineers, managers, and others who wish to gain a basic understanding of SEM microanalysis.

Instructors

Phillip Russell
Distinguished Professor of Physics and Science Education at Appalachian State University and Research Professor of Materials Science and Engineering at NC State University