Richard J. Matyi is a Professor in the College of Nanoscale Science and Engineering at the University at Albany - SUNY and a Senior Scientist at Albany NanoTech. He received his degrees in materials science and engineering from Northwestern University (B.S., 1975; Ph.D., 1983) and MIT (S.M., 1976). From 1982 - 1988 he was at Texas Instruments where his research involved materials characterization by X-ray methods and materials growth by MBE. From 1988 - 2000 he was a Professor in the Department of Materials Science and Engineering at the University of Wisconsin, Madison where his research focused on advanced X-ray methods for materials analysis. Before coming to Albany in 2004, Dr. Matyi was at the National Institute of Standards and Technology where his work included precision X-ray metrology and the application of X-ray reflectometry to semiconductor manufacturing. He is the author or co-author of over 130 publications and holds three U.S. patents.