Course Objectives

• Learn essential principles of two major surface analytical methods – XPS and AES
• Learn capabilities and limitations of techniques
• Become familiar with the many applications of XPS and AES for material analysis, product testing, and quality control
• Learn accurate and reliable practices of quantitative surface analysis

Course Description

Accurate and rapid materials analysis is essential to both baseline product performance and product-life cycle.  Stakeholders increasingly require rapid and unambiguous analysis that can provide immediate insight into product quality and reliability to meet project milestones.  This course is designed to provide technologists, scientists and engineers with essential understanding needed to undertake or integrate effective characterization with the surface analysis techniques of X-Ray Photoelectron Spectroscopy and Auger Electron Spectroscopy.  The course also provides understanding on how to specify these techniques or apply the results from these powerful techniques. Essential approaches towards reliable surface analytical methods and basic principles of XPS and AES will be discussed.  Attendees will gain insight on practical and immediately applicable approaches for accurate qualitative and quantitative analysis.  State-of-the-art commercial instrumentation available will be introduced.  Types of analytical data, i.e., large- and small-area spectroscopy, depth profiling, and imaging will be presented.  Examples of the application of XPS and AES to many types of material analysis and diverse kinds of product-testing and quality-control problems (e.g., surface contamination, corrosion, catalysis, failure analysis, metrology) will be included.  Good practices for spectra processing and data analysis, and examples of common mistakes and strategies towards avoiding them, will be also covered.

Online Costs:
$350 – AVS Platinum Member
$400 – AVS Gold/Silver Member
$400 – Non-Member
$200 – Full Time Student

Course Materials

Course Notes