President-Elect (2025)
Mark Engelhard
Pacific Northwest National Laboratory
email: mark_engelhard @ avs.org
MARK ENGELHARD is a Senior Research Scientist at Pacific Northwest National Laboratory. With a career spanning over 40 years, Mark is considered a leading expert in the fundamentals and applications of surface-sensitive techniques. His research focuses on surfaces and interphases critical to environmental, energy, and catalytic systems involving collaborations with academic, government, and industrial partners.
Mark has published >600 peer-reviewed journal articles and six book chapters with >53,000 citations (Web of Science h index 118) and is recognized as a Highly Cited Researcher by Clarivate Analytics (2018-2023). His scientific contributions have been recognized with the ASTM International Cedric Powell Award (2020), AVS Fellow (2013), and the AVS George Hanyo Award (1997).
Mark is a champion for educating the next generation of researchers, and regularly mentor’s students, postdoctoral, and other early career researchers. Since joining the AVS 34 years ago, Mark has been actively involved at national and regional levels. He currently serves as Chair of the AVS 70 Program, and on the Surface Science Spectra Editorial Board, AVS Topical Conference Committee, and Recommended Practices Committee. He previously served on the AVS Board of Directors (2022-2023), as Chair of ASSD (2021), on the AVS Publications Committee (2008-2010), and has been a member on the Finance, Membership, and Marketing and Communications Committees (2008-2010). Additional involvement includes program committees for AVS 65-66 and several ASSD Surface Analysis and Quantitative Surface Analysis topical conference committees. Regionally, Mark has been a significant contributor to PNWAVS chapter activities, serving as Chair (2013-2014) and Co-Chair of the 39th Surface Analysis, SIMS USA, and 29th and 25th PNWAVS Symposia (2016 & 2014).
Mark has served the broader surface analysis community as Head of the Delegation for the International Organization for Standards (ISO) TC201 on Surface Chemical Analysis (2010-2021) and on the ASTM International Committee E42 (2001-present). His editorial contributions include roles as Guest Editor of the JVST A Special Topic Collection "Reproducibility Challenges and Solutions" and Guest Editor for a JVST A Special Collection on Oxide Thin Films, and several SSS collections. Collectively, these contributions underscore his commitment to advancing the field of surface science, fostering collaboration across various scientific communities, and education of the next generation of scientists.