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DTSTAMP:20260429T184039Z
DTSTART:20240415T110000Z
DTEND:20240418T230000Z
LOCATION: Monterey Marriott, Monterey, California
DESCRIPTION:\nThe FCMN will bring together scientists and engineers interested in all aspects of the characterization technology needed for nanoelectronic materials and device research, development, integration, and manufacturing. All approaches are welcome: chemical, physical, electrical, magnetic, optical, in situ, and real-time control and monitoring. The semiconductor industry is evolving rapidly: the conference will highlight major issues and provide critical reviews of important materials and structure characterization and nearline/inline metrology methods, including hardware, data analysis, and AI and machine learning, as the industry both extends the technology deep into the nanoscale and increases the diversity of devices and systems.\n\n Monterey Marriott, Monterey, California\n\n James Liddle, Alain Diebold
SUMMARY: 2024 Frontiers of Characterization and Metrology for Nanoelectronics (FCMN 2024)
PRIORITY:3
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