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UID:fd546fc4-2a63-402f-baec-a6adf3942b88@avs.org
DTSTAMP:20260314T225520Z
DTSTART:20210615T170000Z
DTEND:20210615T210000Z
LOCATION: Virtual/Online
DESCRIPTION:\nPresenter: Lucille A. Giannuzzi, Ph.D., FAVS, FMSA, FMAS, President, L.A. Giannuzzi & Associates LLC\n\nDifferent FIB source technologies will be introduced. The basics of ion-solid interaction theory will be discussed, including use of ions for different applications and understanding ion implantation damage and how to mitigate it. The expanding applications of plasma FIB instruments compared to traditional Ga+ ion FIBs will be emphasized.  Ion patterning and delayering of semiconductor devices will be presented, and the use of FIBs for nano- and micro- prototyping, including applications for mechanical testing will be presented.  Large area 2D sectioning and 3D FIB-SEM tomography will be covered. FIB methods for S/TEM and APT specimen preparation will be discussed in detail.\n\n Virtual/Online\n\n Heather Korff
SUMMARY: AVS Webinar: Recent Developments and Applications of FIB Sources and Instrumentation
PRIORITY:3
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DESCRIPTION:Reminder
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